Delivering On Power During HPC Test
- 發佈日期 : 2024-07-16
- 資料來源：Semiconductor Engineering
- 瀏覽人次：19
1 volt is not the problem. It’s the 1,000+ amps.
The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the power delivery network (PDN). In response, ATE, wafer probe, and contactor vendors are introducing some innovative approaches and test procedures that can ensure robust power delivery to ATE probe cards and packaged device load boards.
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