Promises and Perils of Parallel Test
- 發佈日期 : 2024-09-12
- 資料來源：https://semiengineering.com/promises-and-perils-of-parallel-test/
- 瀏覽人次：67
Test costs may be reduced, but how much depends on a whole bunch of factors.
Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and the complex tradeoffs required for parallelism.
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