Predicting And Preventing Process Drift
- 發佈日期 : 2024-05-02
- 資料來源：Semiconductor Engineering
- 瀏覽人次：19
AI/ML are increasingly vital for good yield and reliability, but there are still plenty of pitfalls to avoid.
Increasingly tight tolerances and rigorous demands for quality are forcing chipmakers and equipment manufacturers to ferret out minor process variances, which can create significant anomalies in device behavior and render a device non-functional.
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