Heterogeneous Integration and Chiplet System Package Alliance

Test costs may be reduced, but how much depends on a whole bunch of factors.

Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and the complex tradeoffs required for parallelism.

For more details, please follow the link below：【Promises and Perils of Parallel Test】