News

NEWS

Electromigration Concerns Grow In Advanced Packages

  • Date : 2024-04-23
  • Source:Semiconductor Engineering
  • Views :42

Higher density, heat, and more materials make it harder to ensure reliability.

The incessant demand for more speed in chips requires forcing more energy through ever-smaller devices, increasing current density and threatening long-term chip reliability. While this problem is well understood, it’s becoming more difficult to contain in leading-edge designs.

For more details, please follow the link below:【Electromigration Concerns Grow In Advanced Packages